Scanning Electron Microscopes

• Apreo FE-SEM
• Apreo FE-SEM Low Vac SEM*
• JEOL 7000 FE-SEM

Atom Probe

• CAMECA Local Electrode Atom Probe 6000XR

X-Ray Diffraction

• Proto iXRD
• Bruker D8 Discover with GADDS
• Rigaku SMART Lab XRD*
• Rigaku Miniflex XRD*

Focused Ion Beam

• Tescan Lyra FIB FE-SEM
• Helios 5 UX FIB FE-SEM
• Hydra CV PFIB-FE SEM*

Preparation Facilities

• Wet Preparation Facility
• Coating, Milling, and Other Non-Wet Preparation (SEM, TEM)

Transmission Electron Microscopes

• Talos 200i (S)TEM*
• Spectra 300 Probe and Image-corrected (S)TEM*

Optical/Digital Microscopes

• Keyence VHX-7000*

Mechanical Testing

• Nanovea Mechanical Tester*

In Situ Capabilities

Users are responsible for consumables/indentation tips when using these holders.

• DENS Solution Wildfire Single tilt heating platform (TEM)*
• Bruker PI-95 indenter (TEM)*
• Bruker PI-89 indenter (SEM)*