The Tescan Lyra combines a focused ion beam (FIB) column with a field emission scanning electron microscope (FE-SEM) in the cutting and preparation of materials. With the aid of a micromanipulator and gas injection system (GIS), the FIB is used to cut out and lift out materials on the micrometer length scale. These lifted out samples are further refined with the ion beam in service of Atom Probe Tomography (APT) or S/TEM. 

The Lyra also comes equipped with a retractable BSE detector, EDAX Elite Octane EDS and Hikari Pro EBSD detectors.