Scanning Electron Microscopes

• Apreo FE-SEM
• Apreo FE-SEM Low Vac SEM
• JEOL 7000 FE-SEM

Atom Probe

• CAMECA Local Electrode Atom Probe 6000XR

X-Ray Diffraction

• Proto iXRD
• Bruker D8 Discover with GADDS
• Rigaku SMART Lab XRD
• Rigaku Miniflex XRD

Focused Ion Beam

• Tescan Lyra FIB FE-SEM
• Helios 5 UX FIB FE-SEM
• Hydra CV PFIB-FE SEM

Preparation Facilities

• Wet Preparation Facility
• Coating, Milling, and Other Non-Wet Preparation (SEM, TEM)

Transmission Electron Microscopes

• Talos 200i (S)TEM
• Spectra 300 Probe and Image-corrected (S)TEM

Optical/Digital Microscopes

• Keyence VHX-7000

Mechanical Testing

• Nanovea Mechanical Tester

In Situ Capabilities

Users are responsible for consumables/indentation tips when using these holders.

• DENS Solution Wildfire Single tilt heating platform (TEM)
• Bruker PI-95 indenter (TEM)
• Bruker PI-89 indenter (SEM)

X-ray Photoelectron Spectroscopy

• Nexsa G2