The JEOL 7000 field emission scanning electron microscope (FE-SEM) is a high-resolution microscope equipped with a full suite of analytical equipment. In addition to SE and BSE imaging the system has attached Oxford EDS and EBSD equipment.  Holders are also available for this microscope to facilitate TKD mapping.

Operating Instructions

• Basic Operation (PPT)
• Exploring the JEOL Program (PPT)
• Intro to Oxford EDX (PPT)
• Oxford Channel 5 User Manual (PDF)

Resources

• Oxford Instruments
• INCA TIPS (some useful tips when using the Oxford Inca system)
• Microscopy Society of America
• Royal Microscopy Society