The Helios 5 UX is an industry-leading part of the Helios DualBeam line of microscopes. Equipped with an Elstar™ electron column for extreme high-resolution electron imaging and the Thermo Scientific™ Phoenix™ Focused Ion Beam (FIB) column for rapid and precise sample preparation, the Helios 5 UX facilitates high-quality sample preparation for Atom Probe Tomography (APT) or S/TEM.
Included automation features allow for multisite sampling and decreased time from sample loading to finished lift out.
