The Thermo Scientific™ Nexsa™ G2 X-ray Photoelectron Spectrometer (XPS) System is an advanced tool for university researchers seeking comprehensive surface analysis. Fully automated and designed for high throughput, it streamlines data collection to support diverse projects in materials science, chemistry, physics, and engineering. By integrating XPS with complementary techniques like Ion Scattering Spectroscopy (ISS), UV Photoelectron Spectroscopy (UPS), Reflected Electron Energy Loss Spectroscopy (REELS), and Raman Spectroscopy, the Nexsa G2 enables true correlative analysis for deeper understanding of complex materials. Its newly optimized X-ray monochromator allows you to select analysis areas from 10 μm to 400 μm in 5 μm steps, so you can focus precisely on features of interest while maximizing signal quality—ideal for studying micro- and nanostructures in advanced research.
