The Thermo Scientific™ Apreo scanning electron microscope’s (SEM) revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. The Apreo SEM benefits from unique in-lens backscatter detection, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples. The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples. The system is equipped with EDAX Elite Octane EDS detectors, DigiView EBSD detectors and STEM 3+ detectors. Special capabilities offered by the Apreo LowVac system include cathodoluminescence (CLD) imaging and electron channelling contrast imaging (ECCI) for specific material characterization needs. The low-vacuum mode offers a 10 – 500 Pa optional chamber pressure for imaging.
